Atomic Force Microscopy (AFM) is a high-resolution scanning probe microscope used for nano-scale imaging analysis. It uses a probe tip on a cantilever to scan the sample surface. This instrument also provides imaging analysis for virtually all kinds of samples such as polymers, composite materials, and biological samples. This type of microscope is an essential tool in the surface properties analyze or the micro/nano-scale surface construction fields. The Crab-AFM system is specifically developed for nanotechnology education, basic scientific research, and related technical training. OME Technology is an atomic force microscopy manufacturer in Taiwan, committing to provide the best solution for your requirements.

1. Compact size
2. Reliable quality
3. Affordable price
4. Best solution
5. Innovative design